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Raman scattering studies of heavily doped microcrystalline porous silicon and porous silicon free-standing membranes

机译:重掺杂微晶多孔硅和多孔硅自支撑膜的拉曼散射研究

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摘要

The phonon confinement model is often used to analyze Raman scattering band shapes of porous silicon and hence to determine the size of crystallites embedded in the porous layer. We show in this paper, from back-scattering Raman spectra, the importance to avoid using resonant excitation which would select a particular size of nanocrystals. In nonresonant conditions, and working on free-standing porous silicon membranes, broader and more realistic size distributions are found. The disappearance of Fano effect evidences the loss of free carriers in the porous layer. Raman intensity angular variations in parallel and perpendicular polarization configurations are obtained and discussed. They show the presence of unexpected different constant offsets for these two configurations. By comparing with theoretical calculation we deduce that they sign the impact of the porous layer on the light propagation.
机译:声子限制模型通常用于分析多孔硅的拉曼散射能带形状,从而确定嵌入在多孔层中的微晶的尺寸。我们从背向散射拉曼光谱中证明了避免使用共振激发来选择特定尺寸的纳米晶体的重要性。在非共振条件下,并且在独立式多孔硅膜上工作时,发现了更宽,更现实的尺寸分布。法诺效应的消失证明了多孔层中自由载流子的损失。获得并讨论了平行和垂直极化配置中的拉曼强度角变化。它们显示了这两种配置存在意外的不同常数偏移。通过与理论计算进行比较,我们得出结论,它们表明了多孔层对光传播的影响。

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  • 来源
    《Physical review》 |2010年第7期|p.075210.1-075210.11|共11页
  • 作者单位

    INSP, UPMC Universite Paris 06, CNRS UMR 7588, 140 rue de Lourmel, 75015 Paris, Frame Unite Materiaux Avarices et Optronique, Faculte des Sciences de Tunis, 1008 Campus Universilaire Tunis, Tunisia;

    rnINSP, UPMC Universite Paris 06, CNRS UMR 7588, 140 rue de Lourmel, 75015 Paris, Frame;

    rnINSP, UPMC Universite Paris 06, CNRS UMR 7588, 140 rue de Lourmel, 75015 Paris, Frame;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    powders, porous materials; infrared and raman spectra; nanocrystals and nanoparticles;

    机译:粉末;多孔材料;红外和拉曼光谱;纳米晶体和纳米颗粒;

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