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首页> 外文期刊>Physical review >Mean time of the thermal escape in a current-biased long-overlap Josephson junction
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Mean time of the thermal escape in a current-biased long-overlap Josephson junction

机译：电流偏置的长重叠约瑟夫逊结中的平均热逸出时间

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Computer simulations of the fluctuational dynamics of a long-overlap Josephson junction in the frame of the sine-Gordon model with a white noise source have been performed. It has been demonstrated that for the case of constant critical current density the mean escape time (MET) increases with increasing junction length; and for homogeneous bias current distribution the MET tends to a constant, while for inhomogeneous current distribution the MET quickly decreases after approaching a few Josephson lengths. The mean voltage (measured in the noise-induced regime where the phase consequently jumps between neighboring potential minima) versus junction length behaves inversely in comparison with the MET.
机译：在具有白噪声源的正弦-戈登模型框架中，对长重叠约瑟夫森结的波动动力学进行了计算机模拟。已经证明，在恒定临界电流密度的情况下，平均逸出时间（MET）随着结长的增加而增加；对于均匀的偏置电流分布，MET趋于恒定，而对于不均匀的电流分布，MET在接近一些约瑟夫森长度后迅速减小。与MET相比，平均电压（在噪声引起的状态下测量，其中相位因此在相邻电位最小值之间跳变）与结长度的关系相反。

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