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摘要

The counterfeiting of electronic components has become a major challenge in the 21st century. The electronic component supply chain has been greatly affected by widespread counterfeit incidents. A specialized service of testing, detection, and avoidance must be created to tackle the worldwide outbreak of counterfeit integrated circuits (ICs). So far, there are standards and programs in place for outlining the testing, documenting, and reporting procedures. However, there is not yet enough research addressing the detection and avoidance of such counterfeit parts. In this paper we present, in detail, all types of counterfeits, the defects present in them, and their detection methods.We then describe the challenges to implementing these test methods and to their effectiveness. We present several anti-counterfeit measures to prevent this widespread counterfeiting, and we also consider the effectiveness and limitations of these anti-counterfeiting techniques.
机译:电子元器件的假冒已成为21世纪的主要挑战。电子元件供应链已受到广泛的假冒事件的严重影响。必须创建专门的测试,检测和避免服务,以解决全球范围内假冒集成电路(IC)的爆发。到目前为止,已有用于概述测试,文档编制和报告程序的标准和程序。但是,还没有足够的研究来解决这种假冒零件的检测和避免。在本文中,我们详细介绍了所有类型的假冒产品,其中存在的缺陷及其检测方法,然后描述了实施这些测试方法所面临的挑战及其有效性。我们提出了几种防伪措施来防止这种广泛的伪造,并且我们还考虑了这些防伪技术的有效性和局限性。

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