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Phonon softening and crystallographic orientation of strained graphene studied by Raman spectroscopy

机译:拉曼光谱研究应变石墨烯的声子软化和晶体学取向

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摘要

We present a systematic study of the Raman spectra of optical phonons in graphene monolayers under tunable uniaxial tensile stress. Both the G and 2D bands exhibit significant red shifts. The G band splits into 2 distinct subbands (G~+, G~-) because of the strain-induced symmetry breaking. Raman scattering from the G~+ and G~- bands shows a distinctive polarization dependence that reflects the angle between the axis of the stress and the underlying graphene crystal axes. Polarized Raman spectroscopy therefore constitutes a purely optical method for the determination of the crystallographic orientation of graphene.
机译:我们目前对可调谐单轴拉伸应力下石墨烯单层中光学声子的拉曼光谱进行了系统研究。 G和2D波段都显示出明显的红移。由于应变引起的对称性破坏,G波段分为两个不同的子波段(G〜+,G〜-)。来自G〜+和G〜-波段的拉曼散射显示出独特的极化依赖性,反映了应力轴与基础石墨烯晶体轴之间的夹角。因此,偏振拉曼光谱法构成用于确定石墨烯的晶体学取向的纯光学方法。

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    Department of Mechanical Engineering, Columbia University, New York, NY 10027;

    Departments of Physics and Electrical Engineering, Columbia University, New York, NY 10027;

    Department of Mechanical Engineering, Columbia University, New York, NY 10027;

    Departments of Physics and Electrical Engineering, Columbia University, New York, NY 10027;

    Departments of Physics and Electrical Engineering, Columbia University, New York, NY 10027;

    Department of Mechanical Engineering, Columbia University, New York, NY 10027;

  • 收录信息 美国《科学引文索引》(SCI);美国《生物学医学文摘》(MEDLINE);美国《化学文摘》(CA);
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