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首页> 外文期刊>Proceedings of the National Academy of Sciences of the United States of America >Carbon nanotube atomic force microscopy tips: Direct growth by chemical vapor deposition and application to high-resolution imaging
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Carbon nanotube atomic force microscopy tips: Direct growth by chemical vapor deposition and application to high-resolution imaging

机译：碳纳米管原子力显微镜技巧：通过化学气相沉积直接生长并应用于高分辨率成像

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摘要

Carbon nanotubes are potentially ideal atomic force microscopy probes because they can have diameters as small as one nanometer, have robust mechanical properties, and can be specifically function- alized with chemical and biological probes at the tip ends. This communication describes methods for the direct growth of carbon nanotube tips by chemical vapor deposition (CVD) using ethylene and iron catelysts deposited on commercial silicon-cantilever-tip assem- blies. Scanning electron microscopy and transmission electron micros- copy measurements demonstrate that multiwalled nanotube and single-walled nanotube tips can be grown by predictable variations in the CVD growth conditions. Force-displacement measurements made on the tips show that they buckle elastically and have very small (s 100 pN) nonspecific adhesion on mica surfaces in air. Analysis of images recorded on gold nanoparticle standards shows that these multi- and single-walled carbon nanotube tips have radii of Curvature of 3--6 and 2--4 nm. respectively. Moreover, the nanotube tip radii derermined from the nanoparticle images are consistent with those datermined directly by transmission electron microscopy imaging of the nanotube ends. These molecular-scale CVD nanotube probes have been used to image isolated lgG and GroES proteins at high- resolution.
机译：碳纳米管可能是理想的原子力显微镜探针，因为它们的直径可小至一纳米，具有强大的机械性能，并且可以在末端使用化学和生物探针进行特定功能化。本交流介绍了通过使用在商业化的硅悬臂式尖端组件上沉积的乙烯和铁类溶解物通过化学气相沉积（CVD）直接生长碳纳米管尖端的方法。扫描电子显微镜和透射电子显微镜的测量表明，可以通过CVD生长条件的可预测变化来生长多壁纳米管和单壁纳米管尖端。在尖端上进行的力位移测量表明，它们在空气中的云母表面发生弹性弯曲并具有非常小的（s 100 pN）非特异性粘附力。对记录在金纳米粒子标准上的图像的分析表明，这些多壁和单壁碳纳米管尖端的曲率半径为3--6和2--4 nm。分别。而且，从纳米颗粒图像确定的纳米管尖端半径与直接由纳米管末端的透射电子显微镜成像确定的那些一致。这些分子级CVD纳米管探针已用于对高分辨率的IgG和GroES蛋白成像。

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