• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Quality and Reliability Engineering International >Reliability qualification of semiconductor devices based on physics-of-failure and risk and opportunity assessment
【24h】

Reliability qualification of semiconductor devices based on physics-of-failure and risk and opportunity assessment

机译：基于故障物理以及风险和机会评估的半导体器件可靠性鉴定

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

Qualification frequently is a time-critical activity at the end of a development project. As time-to-market is a competitive issue, the most efficient qualification efforts are of interest. A concept is outlined, which proactively integrates qualification into the development process and provides a systematic procedure as a support tool to development and gives early focus on required activities. It converts requirements for a product into measures of development and qualification in combination with a risk and opportunity assessment step and accompanies the development process as a guiding and recording tool for advanced quality planning and confirmation.
机译：在开发项目结束时，资格鉴定经常是时间紧迫的活动。由于上市时间是一个竞争性问题，因此最有效率的资格认证工作值得关注。概述了一个概念，该概念可将资格主动地整合到开发过程中，并提供系统的程序作为开发的支持工具，并尽早关注所需的活动。它结合风险和机会评估步骤，将对产品的需求转化为开发和认证的度量，并伴随开发过程，作为高级质量计划和确认的指导和记录工具。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号