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Nanorheology by atomic force microscopy

机译：纳米流变学的原子力显微镜

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摘要

We present an Atomic Force Microscopy (AFM) based method to investigate the rheological properties of liquids confined within a nanosize gap formed by an AFM tip apex and a solid substrate. In this method, a conventional AFM cantilever is sheared parallel to a substrate surface by means of a lock-in amplifier while it is approaching and retracting from the substrate in liquid. The normal solvation forces and lateral viscoelastic shear forces experienced by the AFM tip in liquid can be simultaneously measured as a function of the tip-substrate distance with sub-nanometer vertical resolution. A new calibration method is applied to compensate for the linear drift of the piezo transducer and substrate system, leading to a more precise determination of the tip-substrate distance. By monitoring the phase lag between the driving signal and the cantilever response in liquid, the frequency dependent viscoelastic properties of the confined liquid can also be derived. Finally, we discuss the results obtained with this technique from different liquid-solid interfaces. Namely, octamethylcyclotetrasiloxane and water on mica and highly oriented pyrolytic graphite.
机译：我们提出了一种基于原子力显微镜（AFM）的方法，以研究由AFM尖端和固体基质形成的纳米间隙中所含液体的流变特性。在这种方法中，传统的AFM悬臂在进入或从液体中移出基板时，会通过锁定放大器平行于基板表面进行剪切。 AFM针尖在液体中所经历的法向溶剂化力和横向粘弹性剪切力可以同时测量为针尖-基底距离的函数，并具有亚纳米级的垂直分辨率。应用了一种新的校准方法来补偿压电换能器和基板系统的线性漂移，从而可以更精确地确定尖端与基板之间的距离。通过监测液体中驱动信号和悬臂响应之间的相位滞后，还可以得出受限液体的频率相关粘弹性。最后，我们讨论了使用该技术从不同的液固界面获得的结果。即，八甲基环四硅氧烷和云母和高度取向的热解石墨上的水。

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