Microscope mode secondary ion mass spectrometry imaging with a Timepix detector

Kiss Andras; Jungmann Julia H.; Smith Donald F.; Heeren Ron M. A.

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Microscope mode secondary ion mass spectrometry imaging with a Timepix detector

机译：使用Timepix检测器的显微镜模式二次离子质谱成像

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摘要

In-vacuum active pixel detectors enable high sensitivity, highly parallel time- and space-resolved detection of ions from complex surfaces. For the first time, a Timepix detector assembly was combined with a secondary ion mass spectrometer for microscope mode secondary ion mass spectrometry (SIMS) imaging. Time resolved images from various benchmark samples demonstrate the imaging capabilities of the detector system. The main advantages of the active pixel detector are the higher signal-to-noise ratio and parallel acquisition of arrival time and position. Microscope mode SIMS imaging of biomolecules is demonstrated from tissue sections with the Timepix detector.

机译：真空内有源像素检测器可对复杂表面的离子进行高灵敏度，高度并行的时间和空间分辨检测。首次将Timepix检测器组件与二次离子质谱仪结合使用，以进行显微镜模式二次离子质谱（SIMS）成像。来自各种基准样品的时间分辨图像证明了检测器系统的成像功能。有源像素检测器的主要优点是较高的信噪比以及并行获取到达时间和位置。使用Timepix检测器从组织切片中展示了生物分子的显微镜模式SIMS成像。

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来源
《Review of Scientific Instruments》 |2013年第1期|p.1-7|共7页
作者
Kiss Andras; Jungmann Julia H.; Smith Donald F.; Heeren Ron M. A.;
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作者单位

FOM Institute AMOLF, Science Park 104, 1098 XG Amsterdam, The Netherlands;

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原文格式 PDF
正文语种 eng
中图分类
关键词
biological tissues; biomedical imaging; molecular biophysics; secondary ion mass spectroscopy; 8714-g; 8757-s;

机译：生物组织生物医学成像;分子生物物理学二次离子质谱;8714-g;8757-s;

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专利

1. Stigmatic imaging of secondary ions in MeV-SIMS spectrometry by linear Time-of-Flight mass spectrometer and the TimePix detector [J] . Jencic Bastjan, Sepec Luka, Vavpetic Primoz, Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms . 2019,第AUGa1期

机译：线性飞行时间质谱仪和TimePix检测器在MeV-SIMS光谱中对二次离子进行像散成像
2. Stigmatic imaging of secondary ions in MeV-SIMS spectrometry by linear Time-of-Flight mass spectrometer and the TimePix detector [J] . Jencic Bastjan, Sepec Luka, Vavpetic Primoz, Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms . 2019,第Auga1期

机译：通过线性飞行时间质谱仪和TimePix检测器升高eMV-SIMS光谱法的次离子耻辱性成像
3. Cluster secondary ion mass spectrometry microscope mode mass spectrometry imaging [J] . András Kiss, Donald F. Smith, Julia H. Jungmann, Rapid Communications in Mass Spectrometry: RCM . 2013,第24期

机译：簇二次离子质谱显微镜模式质谱成像
4. Multi-mass microscope mode imaging mass spectrometry: Application of the Pixel Imaging Mass Spectrometry (PlmMS) Sensor [C] . Benjamin Winter, Edward Halford, Wei Hao Yuen, American Society for Mass Spectrometry Conference on Mass Spectrometry and Allied Topics . 2012

机译：多质量显微镜模式成像质谱：在像素成像质谱（PLMMS）传感器的应用
5. Applying secondary ion mass spectrometry to cellular and model membranes to image component distribution and quantify composition [D] . Wilson, Robert Lloyd. 2012

机译：将二次离子质谱法施加到细胞和模型膜上的图像成分分布和量化组合物
6. Correlative mass spectrometry imaging applying time‐of‐flight secondary ion mass spectrometry and atmospheric pressure matrix‐assisted laser desorption/ionization to a single tissue section [O] . N. Desbenoit, A. Walch, B. Spengler, -1

机译：相关质谱成像将飞行时间二次离子质谱和大气压基质辅助的激光解吸/电离应用于单个组织切片
7. Microscope Mode Secondary Ion Mass Spectrometry Imaging with a Timepix Detector [O] . Kiss, András, Jungmann, Julia H., Smith, Donald F., 2013

机译：使用Timepix进行显微镜模式二次离子质谱成像探测器

Microscope mode secondary ion mass spectrometry imaging with a Timepix detector

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