DEPTH CALIBRATION SAMPLE FOR SECONDARY ION MASS SPECTROMETRY, PRODUCTION METHOD OF THE SAME AND SECONDARY ION MASS SPECTROMETRY

• 1. 液态金属离子源、二次离子质谱仪、二次离子质谱分析方法及其应用 [P] . 中国专利： CN101878515B . 2012.01.11
• 2. 液态金属离子源、二次离子质谱仪、二次离子质谱分析方法及其应用 [P] . 中国专利： CN101878515A . 2010-11-03
• 3. SAMPLE FOR SECONDARY-ION MASS SPECTROMETRY AND METHOD FOR SPECIFYING ANALYZING PART IN METHOD FOR SECONDARY-ION MASS SPECTROMETRY USING SAMPLE DESCRIBED ABOVE [P] . 日本专利： JPH04335131A . 1992-11-24

  机译： 二次离子质谱法样品及上述方法中的二次离子质谱法中分析部分的规定方法

• 4. The sample for depth proofreading of secondary ion mass spectrometry, irradiating the oxygen ion to the production manner and [P] . 日本专利： JP5439793B2 . 2014-03-12

  机译： 二次离子质谱的深度校对样品，以生产方式照射氧离子，

• 5. METHOD OF MEASURING DEPTH-DIRECTION CONCENTRATION DISTRIBUTION OF SAMPLE THROUGH SECONDARY ION MASS SPECTROMETRY [P] . 日本专利： JP2003194745A . 2003-07-09

  机译： 二次离子质谱法测定样品深度方向浓度分布的方法

• 1. Standard-sample bracketing calibration method combined with Mg as an internal standard for silicon isotopic compositions using multi-collector inductively coupled plasma mass spectrometry [J] . Honglin Yuan, Cheng Cheng, Kaiyun Chen, 中国地球化学学报（英文版） . 2016,第004期
• 2. The determination of 52 elements in marine geological samples by an inductively coupled plasma optical emission spectrometry and an inductively coupled plasma mass spectrometry with a high-pressure closed digestion method [J] . GAO Jingjing, LIU Jihua, LI Xianguo, 海洋学报（英文版） . 2017,第001期
• 3. Influence of Basicity on the Formation of Cluster Ions/Adduct Ions for Organic Ammonium Halides by Positive Secondary Ion Mass Spectrometry [J] . 高等学校化学研究：英文版 . 1997,第004期
• 4. A novel sample preparation method of matrix-assisted laser desorption/ionization time of flight mass spectrometry for polystyrene [J] . Shu Zhang, Zhen Wen Zhao, Lei Xiong, 中国化学快报（英文版） . 2007,第006期
• 5. Deconvolution analyses of secondary ion mass spectrometry shallow depth profiles with depth resolution functions from silicon substrate-based delta-doped samples [J] . Mitsuhiro Tomita, Hiroki Tanaka, Mitsuo Koike, Journal of Vacuum Science & Technology . 2009,第4期
• 6. Exploring the Surface Sensitivity of TOF-Secondary Ion Mass Spectrometry by Measuring the Implantation and Sampling Depths of Bi_(n) and C_(60) Ions in Organic Films [J] . Shin Muramoto, Jeremy Brison, David G. Castner Analytical chemistry . 2012,第1期
• 7. Analysis of C_(60)~+ and Cs~+ sputtering ions for depth profiling gold/silicon and GaAs multilayer samples by time of flight secondary ion mass spectrometry [J] . Robyn E. Goacher, Joseph A. Gardella Jr. Applied Surface Science . 2010,第7期
• 8. Development of Mass Spectrometry Sample Preparation Methods foDevelopment of Mass Spectrometry Sample Preparation Methods for Localization and Quantitation of Protein Carbonyls in Biological Matrices [C] . David C. Simpson, Suresh Narayanasamy, Lara Lewellyn, American Society for Mass Spectrometry Conference on Mass Spectrometry and Allied Topics . 2013
• 9. Characterization of novel polymers by time-of-flight secondary ion mass spectrometry, matrix-assisted laser desorption mass spectrometry, and x-ray photoelectron spectroscopy. [D] . Belu, Anna Marie. 1994
• 10. Quantification and micron-scale imaging of spatial distribution of traceberyllium in shrapnel fragments and metallurgic samples with correlative fluorescencedetection method and secondary ion mass spectrometry (SIMS) [O] . Jerrold L. Abraham, Subhash Chandra, Anoop Agrawal -1
• 11. Exploring the Surface Sensitivity of TOF-Secondary Ion Mass Spectrometry by Measuring the Implantation and Sampling Depths of Bin and C60 Ions in Organic Films [O] . Shin Muramoto, Jeremy Brison, David G. Castner 2011
• 12. Method Development and Validation of Comparative Finished Fiber Analysis Using Nano-Sampling Cryomicrotomy and Time-of-Flight Secondary Ion Mass Spectrometry. [R] . C. Zhou D. Griffis D. Hinks K. Beck 2014

• 1. Optimization and Validation of a Method for Heavy Metals Quantification in Soil Samples by Inductively Coupled Plasma Sector Field Mass Spectrometry(ICP-SFMS) [J] . Héctor Hernández-Mendoza ,Marcos Mejuto ,Ana Isabel Cardona . 美国分析化学（英文） . 2013,第10期
• 2. 二次离子质谱研究低能离子注入生物体的深度和浓度分布 [C] . 刘肇萌 ,郝永传 ,胡克昌 . 中国质谱学会第七届学术交流会 . 2002
• 3. 二次离子质谱溅射深度剖析的定量分析 [A] . 康红利 . 2016