Dynamic measurement of work function with the field emission microscope

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Dynamic measurement of work function with the field emission microscope

机译：用场发射显微镜动态测量功函数

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A technique to measure the work function of surfaces covered with adsorbate, during a linear temperature sweep of the emitter using the field emission probe hole microscope is described. A microcomputer records the field emission current values for each applied voltage and calculates the work function and the preexponential factor in real time with the Fowler Nordheim equation. The process is repeated for each temperature value of the desorption spectrum. The technique has been used to study the desorption of hydrogen from tungsten (111).

机译：描述了一种使用场发射探针孔显微镜在发射器的线性温度扫描过程中测量被吸附物覆盖的表面的功函数的技术。微型计算机记录每个施加电压的场发射电流值，并利用Fowler Nordheim方程实时计算功函数和指数前因子。对于解吸光谱的每个温度值重复该过程。该技术已用于研究氢从钨（111）中的解吸。

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《Review of Scientific Instruments》 |1983年第3期|P.337-340|共4页
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Dynamic measurement of work function with the field emission microscope

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