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Near-field probe and the near-field microscope using this tuning fork foundation for spectroscopic measurements, spectroscopy method using the near-field microscope
Near-field probe and the near-field microscope using this tuning fork foundation for spectroscopic measurements, spectroscopy method using the near-field microscope
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机译：使用该音叉基础的近场探针和近场显微镜用于光谱测量，使用近场显微镜的光谱方法
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摘要
PROBLEM TO BE SOLVED: To provide a tuning-fork based near field probe for removing scattering from other parts except for an end part of a nano-probe in a near-field microscope and allowing for spectral analysis by delaying the generation of multiple-reflection waves caused through the shaft of the nano-probe.;SOLUTION: A first characteristic of the invention is to temporally delay the generation of multiple-reflection waves by manufacturing a probe part to have a predetermined length or more in a tuning-fork based near-field probe comprising: a first electrode and a second electrode arranged apart from each other; and a wire-shaped nano-probe attached downward to one end of the first electrode and configured to vibrate in a perpendicular direction with respect to a sample. A second characteristic of the invention is to provide a near-field optical microscope that includes a tuning-fork based near-field probe having a structure as above and can measure a time-domain transient reaction of a scattered wave. A third characteristic of the invention is to provide a method for performing spectral analysis on a time-domain signal measured by the near-field optical microscope.;COPYRIGHT: (C)2015,JPO&INPIT
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