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Tuning fork based near-field probe for a spectral measurement, a 'near-field' microscope, the same is used, and spectrally analyzing method, which is used a a 'near-field' microscope
Tuning fork based near-field probe for a spectral measurement, a 'near-field' microscope, the same is used, and spectrally analyzing method, which is used a a 'near-field' microscope
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机译：使用基于音叉的用于光谱测量的近场探头，“近场”显微镜以及用于“近场”显微镜的光谱分析方法
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摘要
The present invention, it is provided the diffusion of other parts to be removed, in addition to an end portion of a nano probe, in a a "near-field" microscope, and a spectral analysis to make it possible, in that the generation of multiple reflections is delayed by the shaft of the nano probe are caused. A first property of the present invention, a generation of multiple reflections to delay in time, in that a probe portion is produced in such a way that a predetermined length or more in a tuning fork - based near-field probe has. A second property of the present invention is to provide a a "near-field" microscope, which is a tuning fork - based near-field probe having a structure as the top and a time range by means of gear shaft to measure the reaction of a scattered. A third property of the present invention is a method for performing a spectral analysis by means of a time domain signal, which is measured by the a "near-field" microscope.
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