Cryostat for the Measurement of Thermal Conductivity and Specific Heat between 0.05 and 2°K

Harrison J. P.

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Cryostat for the Measurement of Thermal Conductivity and Specific Heat between 0.05 and 2°K

机译：用于测量0.05至2°K之间的导热率和比热的低温恒温器

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A cryostat is described which is capable of measuring specific heat and thermal conductivity of dielectric crystals over the temperature range 0.05 and 2.0°K. Thermal conductivity is measured with a steady flow of heat through the sample, and specific heat by a pulse technique. Differential carbon resistance thermometry is used for both measurements. The performance is demonstrated on the thermal conductivity of LiF, and on the specific heat of two samples of nominally pure KCl.

机译：描述了一种低温恒温器，该低温恒温器能够在0.05和2.0°K的温度范围内测量介电晶体的比热和导热率。通过样品中稳定的热量流和通过脉冲技术的比热来测量热导率。差示碳电阻测温法用于两种测量。该性能在LiF的热导率和两个标称纯KCl样品的比热上得到证明。

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《Review of Scientific Instruments》 |1968年第2期|共8页
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Harrison J. P.;
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Cryostat for the Measurement of Thermal Conductivity and Specific Heat between 0.05 and 2°K

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