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Modern Methods and Means for Nondestructive Testing of the Quality of Power Semiconductor Devices

机译:功率半导体器件质量的无损检测的现代方法和手段

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摘要

Modern methods and means for designing devices for nondestructive testing of parameters of power semiconductor devices are described. A new method for determining the junction-case thermal resistance from the transition function of a thermosensitive parameter is presented. The operating principle of a specialized digital system for controlling and displaying the vibration frequency and linear accelerations during testing of the absence of freely moving particles, short circuits, and breaks in the circuits of electrodes is presented. The function of digital filtering of a signal that is formed by the sensor-accelerometer board is considered. A new method for the formation of a single shock-current pulse is described that is based on the use of the principle of a discrete superposition of charges in the electric circuit of the secondary winding of a power pulse transformer. The principle of the formation of a test voltage pulse in a test-pulse generator of the software-hardware complex for the automatic assignment of grades, which is based on the implementation of the pulse-amplitude modulation of pulse parameters in a galvanically isolated power control loop, is presented.
机译:描述了用于设计用于功率半导体器件的参数的非破坏性测试的器件的现代方法和手段。提出了一种从热敏参数的跃迁函数确定结壳热阻的新方法。提出了一种专用数字系统的工作原理,该系统用于控制和显示测试过程中的振动频率和线性加速度,以测试电极中是否存在自由移动的微粒,短路和断裂。考虑了由传感器加速度计板形成的信号的数字滤波功能。描述了一种用于形成单个冲击电流脉冲的新方法,该方法基于在功率脉冲变压器的次级绕组的电路中使用电荷的离散叠加原理。在软硬件组合的测试脉冲发生器中形成测试电压脉冲以自动分配等级的原理,该原理基于电隔离功率控制中脉冲参数的脉冲幅度调制的实现循环,介绍。

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