Evaluation of Oxidized-Low-Density Lipoproteins Using Kelvin Force Microscopy

Takeda; S.; Ohkawa; F.; Hui; S.-P.; Sakurai; T.

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Evaluation of Oxidized-Low-Density Lipoproteins Using Kelvin Force Microscopy

机译：使用开尔文力显微镜评估氧化的低密度脂蛋白

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Oxidized-low-density lipoprotein (ox-LDL), which is generated by LDL oxidation, is a risk factor of cardiovascular disease development. LDL has positive charges on the surface attributable to amino groups of lysine moieties on Apo B-100. Its positive charge is decreased by oxidation. For this paper, the topography and surface potential of LDL and ox-LDL are measured using atomic force microscopy and Kelvin probe force microscopy (KPFM). Although it is difficult to ascertain a difference between topographic images of LDL and ox-LDL, the KPFM images of ox-LDL differ from those obtained using LDL. The averaged potential of the surface decreases concomitantly with increasing oxidation time of the LDL. We demonstrate a method to evaluate the oxidation level of LDL using KPFM.

机译：LDL氧化产生的氧化型低密度脂蛋白（ox-LDL）是心血管疾病发展的危险因素。 LDL在表面上具有正电荷，这归因于Apo B-100上的赖氨酸部分的氨基。其正电荷通过氧化而减少。对于本文，使用原子力显微镜和开尔文探针力显微镜（KPFM）测量LDL和ox-LDL的形貌和表面电势。尽管很难确定LDL和ox-LDL的地形图之间的差异，但是ox-LDL的KPFM图像与使用LDL所获得的图像有所不同。表面的平均电势随LDL氧化时间的增加而降低。我们演示了一种使用KPFM评估LDL氧化水平的方法。

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《IEEE sensors journal》 |2013年第9期|3449-3453|共5页
作者
Takeda; S.; Ohkawa; F.; Hui; S.-P.; Sakurai; T.;
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Faculty of Health Sciences, Hokkaido University, Sapporo, Japan|c|;

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正文语种 eng
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Kelvin probe force microscopy; bioelectric phenomena; biotechnology; low-density lipoprotein;

机译：开尔文探针力显微镜;生物电现象;生物技术;低密度脂蛋白;

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1. High-resolution Kelvin probe microscopy in corrosion science: Scanning Kelvin probe force microscopy (SKPFM) versus classical scanning Kelvin probe (SKP) [J] . Michael Rohwerder, Florin Turcu Electrochimica Acta . 2007,第2期

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2. Cross-sectional observation in nanoscale for Si power MOSFET by atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy [J] . Doi Atsushi, Nakajima Mizuki, Masuda Sho, Japanese journal of applied physics . 2019,第期

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3. Observation of silicon carbide Schottky barrier diode under applied reverse bias using atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy [J] . Uruma Takeshi, Satoh Nobuo, Yamamoto Hidekazu Japanese journal of applied physics . 2017,第8s1期

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4. Application of Kelvin force microscopy for evaluation of oxidized low-density lipoprotein [C] . Takeda Seiji, Ohkawa Futaba, Sakurai Toshihiro, IEEE Sensors . 2012

机译：开尔文力显微镜在氧化型低密度脂蛋白评估中的应用
5. Fundamentals of Kelvin Probe Force Microscopy and its Applications in the Characterization of Solar Cells [D] . Lan, Fei. 2017

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6. Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals [O] . Yann Almadori, David Moerman, Jaume Llacer Martinez, 2018

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7. Present State of the Surface Potential Measurements by Kelvin Force Microscopy. Analysis of Corrosion Reaction on Metal by Kelvin Force Microscopy. [O] . Hiroyuki MASUDA 2001

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Evaluation of Oxidized-Low-Density Lipoproteins Using Kelvin Force Microscopy

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