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首页> 外文期刊>IEEE sensors journal >Investigation and Modeling of Large Barkhausen Jumps Dynamics in Low-Power Fluxgate Magnetometers
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Investigation and Modeling of Large Barkhausen Jumps Dynamics in Low-Power Fluxgate Magnetometers

机译：低功率磁通门磁力计中大型Barkhausen跳跃动力学的研究和建模

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Large Barkhausen jumps occur in low-power fluxgates output and seriously affect the signal fidelity and therefore the magnetometer functionality. In this paper, we investigate the occurrence of DC jumps in two types of fluxgates, parallel and orthogonal. We present a new model for the jumps phenomenon. This model is based on the reversal dynamics of magnetic domains in the core metallurgical super-structures. We expand the model to explain how and why the jumps subside in time. We show that although the jumps rate decays exponentially in time, the process never completely stops. The understanding of DC jumps dynamics may be utilized in research and development of low-power magnetic sensors. It may he used to characterize and standardize the quality of magnetic sensors cores and used to screen faulty cores that exhibit exceptionally high jump rate that may affect signal fidelity. Mitigating the jumps in both parallel and orthogonal low-power fluxgates is crucial for low-noise magnetic measurement systems.
机译：在低功率磁通门输出中会发生较大的巴克豪森跳变，并严重影响信号保真度，从而严重影响磁力计的功能。在本文中，我们研究了两种类型的磁通门（平行和正交）中直流跳变的发生。我们提出了一种跳跃现象的新模型。该模型基于核心冶金超结构中磁畴的逆向动力学。我们扩展模型以解释跳跃如何以及为什么会及时消退。我们表明，尽管跳跃率随时间呈指数级下降，但该过程永远不会完全停止。直流跳跃动力学的理解可用于低功率磁传感器的研究和开发中。他可能会用来表征和标准化磁传感器芯的质量，并可能用于筛选故障芯，这些芯表现出异常高的跳变率，从而可能影响信号保真度。缓解并行和正交低功率磁通门中的跳变对于低噪声磁测量系统至关重要。

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