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首页> 外文期刊>IEEE Journal of Solid-State Circuits >A 3-Gb/s Optical Detector in Standard CMOS for 850-nm Optical Communication
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A 3-Gb/s Optical Detector in Standard CMOS for 850-nm Optical Communication

机译:标准CMOS中的3 Gb / s光学检测器,用于850 nm光通信

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This paper presents a monolithic optical detector, consisting of an integrated photodiode and a preamplifier in a standard 0.18-μm CMOS technology. A data rate of 3 Gb/s at BER < 10{sup}(-11) was achieved for A = 850 nm with 25-μW peak-peak optical power. This data rate is more than four times than that of current state-of-the-art optical detectors in standard CMOS reported so far. High-speed operation is achieved without reducing circuit responsivity by using an inherently robust analog equalizer that compensates (in gain and phase) for the photodiode roll-off over more than three decades. The presented solution is applicable to various photodiode structures, wavelengths, and CMOS generations.
机译:本文介绍了一种单片光学检测器,它由集成光电二极管和采用标准0.18-μmCMOS技术的前置放大器组成。对于A = 850 nm,峰峰值光功率为25μW,在BER <10 {sup}(-11)时达到了3 Gb / s的数据速率。该数据速率是迄今为止报告的标准CMOS中当前最新光学检测器速率的四倍以上。通过使用固有的稳健的模拟均衡器(在增益和相位方面)对光电二极管的滚降进行了三十多年的补偿,可以在不降低电路响应性的情况下实现高速工作。提出的解决方案适用于各种光电二极管结构,波长和CMOS世代。

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