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首页> 外文期刊>IEEE Journal of Solid-State Circuits >Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors
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Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors

机译:双极晶体管自热和互热耦合阻抗的提取与建模

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摘要

A measurement system comprised of an ultra-low-distortion function generator, lock-in amplifier, and semiconductor parameter analyzer is used for sensitive extraction of the small-signal thermal impedance network of bipolar devices and circuits. The extraction procedure is demonstrated through measurements on several silicon-on-glass NPN test structures. Behavioral modeling of the mutual thermal coupling obtained by fitting a multipole rational complex function to measured data is presented.
机译:由超低失真函数发生器,锁相放大器和半导体参数分析仪组成的测量系统用于双极性器件和电路的小信号热阻抗网络的敏感提取。通过对几种玻璃硅NPN测试结构的测量证明了提取程序。提出了通过将多极有理复函数拟合到测量数据获得的互热耦合的行为模型。

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