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首页> 外文期刊>IEEE Journal of Solid-State Circuits >An ASIC for Hartmann-Shack wavefront detection
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An ASIC for Hartmann-Shack wavefront detection

机译：用于Hartmann-Shack波前检测的ASIC

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摘要

An analog VLSI circuit facilitating the focal point positionndetection in a Hartmann-Shack wavefront sensor for optical wavefrontnmeasurements is presented. Detecting the lateral deviation of each focalnpoint of the Hartmann-Shack sensor's lens array caused by the partialndistortion of the aberrated wavefront within the according lens, thenphase information of the light beam can be retrieved. With the futurenaim of measuring optical distortions of the human eye, the ASIC isnoptimized to process an optical incident power of 1 nW per focal point.nTo prevent spatial aliasing of the focal point positions due to theneye's inherent movements during measurement, the signal processingncircuits are designed to allow frame repetition rates of wavefrontnmeasurement of several hundred hertz. Experimental measurements ofnoptical lenses show the capability of the prototype ASIC of measuringnfocal point position deviations relating to spherical and cylindricalnwavefront aberrations with a dynamic range of ±1 diopters at annaccuracy of ±0.15 diopters. The incident power of 1 nW per focalnpoint thereby allows integration periods of 1 ms for position detection
机译：提出了一种模拟VLSI电路，该电路有助于在Hartmann-Shack波前传感器中进行光波前测量的焦点位置检测。检测由相应透镜内的像差波前的部分扭曲引起的Hartmann-Shack传感器的透镜阵列的每个焦点的横向偏移，然后可以检索光束的相位信息。为了测量人眼的光学畸变，对ASIC进行了优化以处理每个焦点1 nW的光入射功率。n为了防止在测量过程中眼睛固有的移动导致焦点位置出现空间混叠，设计了信号处理电路使波前测量的帧重复率达到几百赫兹。光学透镜的实验测量表明，原型ASIC能够测量与球形和圆柱形波前像差有关的焦点位置偏差，其动态范围为±0.15屈光度，而±1屈光度的动态范围。每个焦点的入射功率为1 nW，因此允许1 ms的积分周期用于位置检测

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