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Efficient generation of pre-silicon MOS model parameters for earlycircuit design

机译:高效生成硅前MOS模型参数以进行早期电路设计

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摘要

The technology development cycle continues to shrink, which verynoften requires evaluation of circuit design and technology choices usingncircuit simulators at the time when no real silicon is available. Innthis paper, we present an efficient methodology for generatingnpre-silicon device models for advanced CMOS processes. The methodologynallows accurate prediction of the full MOS I-V characteristics for thenfuture technologies combining a constraint backpropagation algorithmnbased upon a few critical specifications, physical models for thenadvanced device phenomena, and the empirical data from devices of annexisting technology. The methodology has been tested on two CMOSnproduction technologies. Good prediction results are achieved: for nMOSnthe rms error is 1%-2%, for pMOS it is 2%-4%
机译:技术开发周期不断缩短,这在无可用硅的时候通常需要使用电路模拟器评估电路设计和技术选择。因此,我们提出了一种用于为高级CMOS工艺生成硅前器件模型的有效方法。该方法不允许对未来技术的全部MOS I-V特性进行准确的预测,它结合了基于一些关键规范的约束反向传播算法,先进器件现象的物理模型以及附件技术器件的经验数据。该方法已在两种CMOSn生产技术上进行了测试。获得了良好的预测结果:对于nMOSn,均方根误差为1%-2%,对于pMOS为2%-4%

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