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首页> 外文期刊>IEEE Journal of Solid-State Circuits >A scannable pulse-to-static conversion register array for self-timed circuits
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A scannable pulse-to-static conversion register array for self-timed circuits

机译:用于自定时电路的可扫描脉冲-静态转换寄存器阵列

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This paper describes the design and hardware results of a scannable pulse-to-static conversion register array for self-timed circuits. The circuits include a self-timed control circuit and a 64-bit register array, both designed utilizing self-resetting CMOS (SRCMOS) circuit techniques. The self-timed feature of the control block allows it to require only one system clock input. The evaluation, reset, and write-enable controls are all generated within the control macro. The register array is a level-sensitive scan design, which is compatible and complies with SRCMOS test modes. This type of register array can facilitate the synchronous/asynchronous interfaces, pipelined operation, power management, and testing of advanced digital systems employing a mixture of static and dynamic circuits to achieve low power and high performance.
机译:本文描述了用于自定时电路的可扫描脉冲-静态转换寄存器阵列的设计和硬件结果。这些电路包括一个自定时控制电路和一个64位寄存器阵列,两者均利用自复位CMOS(SRCMOS)电路技术进行设计。控制模块的自定时功能使其仅需要一个系统时钟输入即可。评估,重置和可写控件都在控件宏中生成。寄存器阵列是一种对电平敏感的扫描设计,可以兼容并符合SRCMOS测试模式。这种类型的寄存器阵列可以促进同步/异步接口,流水线操作,电源管理以及采用静态和动态电路混合以实现低功耗和高性能的高级数字系统的测试。

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