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Temperature dependence of absorption edge anisotropy in 2H-MoSe2 layered semiconductors

机译:2H-MoSe2层状半导体中吸收边缘各向异性的温度依赖性

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The absorption-edge anisotropy of 2H-MoSe2 was studied by photoconductivity (PC) measurements as a function of temperature in the range of 12-300 K. A significant shift towards lower energies has been observed in the PC spectra on the edge plane with respect to those corresponding to the van der Waals (VdW) plane. The parameters that describe the temperature dependence of the absorption edges are evaluated by the Bose-Einstein empirical expression. Effective phonon energy was estimated from the temperature dependence of the Urbach energy. The estimated effective phonon energy for the VdW and edge planes, respectively, can be correlated to the observed Raman active E-1g and A(1g) modes. (c) 2006 Elsevier Ltd. All rights reserved.
机译:通过光导率(PC)测量研究了2H-MoSe2的吸收边缘各向异性,它是温度在12-300 K范围内的函数。在边缘平面的PC光谱中,观察到了向较低能量的显着变化对应于范德华(VdW)平面的那些。通过Bose-Einstein经验表达式评估描述吸收边缘温度依赖性的参数。有效声子能量是根据Urbach能量的温度依赖性估算的。分别针对VdW和边缘平面估计的有效声子能量可以与观察到的拉曼有源E-1g和A(1g)模式相关。 (c)2006 Elsevier Ltd.保留所有权利。

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