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Growth of Bi-Sb alloy thin films and their characterization by TEM, PIXE and RBS

机译:Bi-Sb合金薄膜的生长及其TEM,PIXE和RBS表征

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Polycrystalline bulk materials of Bi93Sb7 Bi88Sb12, Bi85Sb15 and Bi80Sb20 were synthesized by melt-quench technique starting from the stoichiometric mixture of constituent elements. The phase purity and compositional uniformity of bulk materials were investigated using powder X-ray diffraction (XRD) and proton induced X-ray emission (PIXE) experiments. The single phase formation and the compositional analysis of thin films were confirmed by transmission electron microscopy (TEM) and Rutherford backscattering spectroscopy (RBS). X-ray diffraction studies confirmed the phase homogeneity of the materials. Atomic concentration ratio of constituent elements (Bi and Sb) determined by PIXE and RBS revealed that near-stoichiometric composition is nearly the same in the bulk as well as in thin film forms. (c) 2004 Elsevier Ltd. All rights reserved.
机译:从组成元素的化学计量混合物出发,通过熔融淬火技术合成了Bi93Sb7 Bi88Sb12,Bi85Sb15和Bi80Sb20的多晶块状材料。使用粉末X射线衍射(XRD)和质子诱导的X射线发射(PIXE)实验研究了散装材料的相纯度和组成均匀性。通过透射电子显微镜(TEM)和卢瑟福背散射光谱(RBS)证实了薄膜的单相形成和组成分析。 X射线衍射研究证实了材料的相均质性。通过PIXE和RBS确定的组成元素(Bi和Sb)的原子浓度比表明,在本体以及薄膜形式中,接近化学计量的成分几乎相同。 (c)2004 Elsevier Ltd.保留所有权利。

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