...
首页> 外文期刊>Solid-State Electronics >Performances of two-finger stacked fin quinary indium gallium zinc aluminum oxide thin-film transistors
【24h】

Performances of two-finger stacked fin quinary indium gallium zinc aluminum oxide thin-film transistors

机译:两指堆叠鳍状五元铟镓锌铝氧化物薄膜晶体管的性能

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

The two-finger stacked bottom gate and top gate fin indium gallium zinc aluminum oxide thin-film transistors (IGZAO TFTs) were fabricated. Since the bottom induced channel layer and the top induced channel layer were formed in the stacked TFTs using the bottom gate and the top gate, simultaneously. Consequently, drain-source current and transconductance of the stacked TFTs were enhanced about twice as those of the bottom gate TFTs and the top gate TFTs. The optimal performances of the stacked TFTs could be obtained, when the whole channel layer was induced as the carrier transportation path.
机译:制造了两指堆叠的底栅和顶栅鳍铟镓锌铝氧化物薄膜晶体管(IGZAO TFT)。由于底部感应沟道层和顶部感应沟道层是同时使用底部栅极和顶部栅极形成在堆叠的TFT中的。因此,堆叠的TFT的漏极-源极电流和跨导被增强为底栅TFT和顶栅TFT的漏极和跨导的两倍。当整个沟道层被诱导为载流子传输路径时,可以获得堆叠式TFT的最佳性能。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号