Determination of the Wenzel roughness parameter by the Power Spectral Density of functional Alumina surfaces

Jardim P. L. G.; Horowitz F.; Felde N.; Schroeder S.; Coriand L.; Duparre A.

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Determination of the Wenzel roughness parameter by the Power Spectral Density of functional Alumina surfaces

机译：通过功能氧化铝表面的功率谱密度确定Wenzel粗糙度参数

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The Wenzel roughness parameter of isotropic Gaussian surfaces is analytically described in terms of the Power Spectral Density function without the smooth surface approximation. This Wenzel roughness parameter Power Spectral Density link was examined for distinct roughnesses of Aluminum-oxide thin films. The Power Spectral Density functions of the surfaces were determined in a wide spatial frequency range by combining different scan areas of Atomic Force Microscopy measurements. The calculated results presented a good agreement with the Wenzel roughness parameter values obtained directly from the topography measured by Atomic Force Microscopy. Finally, wetting behavior was ascertained through determination of water contact angles, including superhydrophobic behavior. This approach, together with an empirical procedure based on a structural parameter, can predict the wetting properties of a surface by taking all its relevant roughness components into account. (C) 2016 Elsevier B.V. All rights reserved.

机译：各向同性高斯表面的Wenzel粗糙度参数是根据功率谱密度函数进行分析性描述的，而没有平滑的表面近似值。针对氧化铝薄膜的不同粗糙度，检查了此Wenzel粗糙度参数功率谱密度链接。通过组合原子力显微镜测量的不同扫描区域，可以在较宽的空间频率范围内确定表面的功率谱密度函数。计算结果与直接从由原子力显微镜测量的形貌获得的Wenzel粗糙度参数值具有良好的一致性。最后，通过确定水接触角来确定润湿行为，包括超疏水行为。这种方法与基于结构参数的经验方法一起，可以通过考虑所有相关的粗糙度分量来预测表面的润湿特性。（C）2016 Elsevier B.V.保留所有权利。

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来源
《Thin Solid Films》 |2016年第1期|57-62|共6页
作者
Jardim P. L. G.; Horowitz F.; Felde N.; Schroeder S.; Coriand L.; Duparre A.;
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作者单位

Univ Fed Rio Grande do Sul, Programa Posgrad Microeletron, Inst Fis, BR-91501970 Porto Alegre, RS, Brazil;

Univ Fed Rio Grande do Sul, Programa Posgrad Microeletron, Inst Fis, BR-91501970 Porto Alegre, RS, Brazil;

Fraunhofer Inst Appl Opt & Precis Engn, D-07745 D Jena, Germany;

Fraunhofer Inst Appl Opt & Precis Engn, D-07745 D Jena, Germany;

Fraunhofer Inst Appl Opt & Precis Engn, D-07745 D Jena, Germany;

Fraunhofer Inst Appl Opt & Precis Engn, D-07745 D Jena, Germany;

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正文语种 eng
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关键词
Wenzel roughness parameter; Power Spectral Density; Gaussian surface; Wetting; Superhydrophobicity;

机译：Wenzel粗糙度参数;功率谱密度;高斯表面;润湿;超疏水性;

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1. SURFACE PREPARATION OF CRYSTAL AND CHARACTERIZATION OF SURFACE ROUGHNESS USING POWER SPECTRAL DENSITY ANALYSIS [J] . Nidhi Paliwal, Rina Sharma, Mahesh Chand, MTT: Manufacturing Technology Today . 2012,第3期

机译：利用功率谱密度分析法进行晶体的表面制备和表面粗糙度的表征
2. Characterization of nanoscale roughness in single point diamond turned optical surfaces using power spectral density analysis [J] . Gufran Sayeed Khan, Rama Gopal V Sarepaka, K D Chattopadhyay Indian journal of engineering and materials sciences . 2004,第1期

机译：使用功率谱密度分析表征单点金刚石车削光学表面的纳米级粗糙度
3. Roughness Power Spectral Density as a Function of Aerial Image and Basic Process / Resist Parameters [J] . Charlotte Cutler, Choong-Bong Lee, James W. Thackeray, Journal of Photopolymer Science and Technology . 2020,第6期

机译：粗糙度功率谱密度作为空中图像和基本过程/抗蚀剂参数的函数
4. Roughness Power Spectral Density as a Function of Aerial Image and Basic Process / Resist Parameters [C] . Charlotte Cutler, Choong-Bong Lee, James W. Thackeray, Advances in Patterning Materials and Processes XXXVI . 2019

机译：粗糙度功率谱密度随航拍图像和基本过程/抗力参数的变化
5. The effect of surface roughness parameters on contact and wettability of solid surfaces. [D] . Zhang, Yilei. 2007

机译：表面粗糙度参数对固体表面接触和润湿性的影响。
6. Nanoscale measurement of the power spectral density of surface roughness: how to solve a difficult experimental challenge [O] . Juan Francisco González Martínez, Inés Nieto-Carvajal, José Abad, 2012

机译：纳米级测量表面粗糙度的功率谱密度：如何解决困难的实验挑战
7. Characterization of Nano-scale Roughness in Single Point Diamond Turned Optical Surfaces using Power Spectral Density Analysis [O] . Khan G.S., Ramagopal S.V., Chattopadhyay K.D., 2004

机译：使用功率谱密度分析表征单点金刚石车削光学表面的纳米级粗糙度
8. Surface Roughness Determination Using Spectral Correlations of ScatteredIntensities and an Artificial Neural Network Technique [R] . Yoshitomi, K., Ishimaru, A., Hwang, J. N., 1993

机译：用散射强度的光谱相关和人工神经网络技术确定表面粗糙度

Determination of the Wenzel roughness parameter by the Power Spectral Density of functional Alumina surfaces

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