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Development of microcrystalline silicon carbide window layers by hot-wire CVD and their applications in microcrystalline silicon thin film solar cells

机译:热线CVD开发微晶碳化硅窗口层及其在微晶硅薄膜太阳能电池中的应用

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摘要

Microcrystalline silicon carbide (μc-SiC:H) thin films in stoichiometric form were deposited from the gas mixture of monomethylsilane (MMS) and hydrogen by Hot-Wire Chemical Vapor Deposition (HWCVD). These films are highly conductive n-type. The optical gap E_04 is about 3.0-3.2 eV. Such pc-SiGH window layers were successfully applied in n-side illuminated n-i-p microcrystalline silicon thin film solar cells. By increasing the absorber layer thickness from 1 to 2.5 pm, the short circuit current density (jsc) increases from 23 to 26 mA/cm~2 with Ag back contacts. By applying highly reflective ZnO/Ag back contacts, jsc=29.6 mA/cm~2 and tj=9.6% were achieved in a cell with a 2-μm-thick absorber layer.
机译:通过热线化学气相沉积(HWCVD)从单甲基硅烷(MMS)和氢气的气体混合物中沉积化学计量形式的微晶碳化硅(μc-SiC:H)薄膜。这些膜是高导电性的n型。光学间隙E_04约为3.0-3.2eV。此类pc-SiGH窗口层已成功应用于n侧照明n-i-p微晶硅薄膜太阳能电池。通过将吸收层的厚度从1 pm增加到2.5 pm,带有Ag后触点的短路电流密度(jsc)从23 mA / cm〜2增加到了26 mA / cm〜2。通过使用高反射率的ZnO / Ag背接触,在具有2μm厚吸收层的电池中实现了jsc = 29.6 mA / cm〜2和tj = 9.6%。

著录项

  • 来源
    《Thin Solid Films》 |2011年第14期|p.4523-4526|共4页
  • 作者单位

    IEK5-Photovoltaik, Forschungszentrum Jiilich, Jillich 52425, Germany ,State Key Laboratory of Silicon Materials, Zhejiang University, Hangzhou 310027, China;

    IEK5-Photovoltaik, Forschungszentrum Jiilich, Jillich 52425, Germany;

    State Key Laboratory of Silicon Materials, Zhejiang University, Hangzhou 310027, China;

    IEK5-Photovoltaik, Forschungszentrum Jiilich, Jillich 52425, Germany;

    IEK5-Photovoltaik, Forschungszentrum Jiilich, Jillich 52425, Germany;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    silicon carbide; microcrystalline material; hot-wire cvd; thin film; solar cells;

    机译:碳化硅;微晶材料;热线CVD;薄膜;太阳能电池;

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