Surface Studies of Chemical-Vapor-Deposited Diamond Thin Films, Cubic Boron Nitride, and Graphite by Reflection High-Energy Electron Diffraction (RHEED), Atomic Force Microscopy (AFM), and Scanning Tunneling Microscopy (STM)

Tomohide TAKAMI; Katsunori SUZUKI; Tetsuro MINE; Isao KUSUNOKI; Kian-Ping LOH; Isao SAKAGUCHI; Mikka NISHITANI-GAMO; Takashi TANIGUCHI; Toshihiro ANDO

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Surface Studies of Chemical-Vapor-Deposited Diamond Thin Films, Cubic Boron Nitride, and Graphite by Reflection High-Energy Electron Diffraction (RHEED), Atomic Force Microscopy (AFM), and Scanning Tunneling Microscopy (STM)

机译：通过反射高能电子衍射（RHEED），原子力显微镜（AFM）和扫描隧道显微镜（STM）对化学气相沉积的金刚石薄膜，立方氮化硼和石墨进行表面研究

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We have already studied epitaxial diamond thin films and cubic boron nitride by using scanning probe microscopy and electron diffraction, and have published or submitted the fruits in some journals. Here, we demonstrate what are difficult to present in formal journals; i.e., failed experiments to form diamond on SiC/Si(001) and NdFeB magnet, light emission during the RHEED measurements, and uncertain AFM and STM images. The developments of a new apparatus for the study of diamond and related materials are also shown.

机译：我们已经通过扫描探针显微镜和电子衍射研究了外延金刚石薄膜和立方氮化硼，并在一些期刊上发表或提交了这些成果。在这里，我们演示了在正式期刊中很难呈现的内容；也就是说，在SiC / Si（001）和NdFeB磁体上形成金刚石的实验失败，RHEED测量期间的发光以及不确定的AFM和STM图像。还显示了一种用于研究金刚石和相关材料的新设备的开发。

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《東北大学科学計測研究所報告》 |2001年第1期|p.1-16|共16页
作者
Tomohide TAKAMI; Katsunori SUZUKI; Tetsuro MINE; Isao KUSUNOKI; Kian-Ping LOH; Isao SAKAGUCHI; Mikka NISHITANI-GAMO; Takashi TANIGUCHI; Toshihiro ANDO;
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Laboratory of Surface Chemistry;

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中图分类工业技术现状与发展;
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1. Report on the Studies of the Surfaces of Chemical-Vapor-Deposited (CVD) Thin Diamond Films Conducted by Reflection High-Energy Electron Diffraction (RHEED), Atomic Force Microscopy (AFM), and Scanning Tunneling Microscopy (STM) [J] . Tomohide TAKAMI 東北大学科学計測研究所報告 . 2001,第1期

机译：通过反射高能电子衍射（RHEED），原子力显微镜（AFM）和扫描隧道显微镜（STM）进行化学气相沉积（CVD）金刚石薄膜表面研究的报告
2. Study of Resonant Tunneling in Au Nanoclusters on the Surface of Si02/Si Thin Films Using the Combined Scanning Tunneling Microscopy and Atomic-Force Microscopy Technique [J] . M. A. Lapshina, D. O. Filatov, D. A. Antonov, Journal of surface investigation: x-ray, synchrotron and neutron techniques . 2009,第4期

机译：结合扫描隧道显微镜和原子力显微镜技术研究SiO 2 / Si薄膜表面金纳米团簇中的共振隧穿
3. Structures of Co and Pt nanoclusters on a thin film of Al_2O_3/NiAl( 100) from reflection high-energy electron diffraction and scanning-tunnelling microscopy [J] . M.F. Luo, W.H. Wen, C.S. Lin, Surface Science . 2007,第10期

机译：反射高能电子衍射和扫描隧道显微镜观察Al_2O_3 / NiAl（100）薄膜上Co和Pt纳米团簇的结构
4. Characterisation of the surface morphology and electronic structure of YBa_2Cu_3O_(7-x) thin films by atomic force and scanning tunneling microscopies [C] . A G Fitzgerald, Y C Fan, H C Xu, Institute of Physics Electron Microscopy and Analysis Group conference . 1997

机译：YBa_2Cu_3O_（7-x）薄膜的表面形貌和电子结构的原子力和扫描隧道显微镜表征
5. Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) studies of carbon fibers and interfacial bonding in polyimide composites. [D] . Jangchud, Ittipol. 1996

机译：扫描隧道显微镜（STM）和原子力显微镜（AFM）研究聚酰亚胺复合材料中的碳纤维和界面结合。
6. In situ Control of Si/Ge Growth on Stripe-Patterned Substrates Using Reflection High-Energy Electron Diffraction and Scanning Tunneling Microscopy [O] . B Sanduijav, G Springholz 2010

机译：利用反射高能电子衍射和扫描隧道显微镜原位控制条形衬底上Si / Ge的生长
7. Reflection high-energy electron diffraction and scanning tunneling microscopy study of InP(001) surface reconstructions [O] . LaBella, V. P., Ding, Z., Bullock, D. W., 2015

机译：反射高能电子衍射和扫描隧道 Inp（001）表面重建的显微镜研究
8. Interfacial and surface properties of thin Fe and Gd films grown on W(110) as studied by scanning tunneling microscopy, site-resolved photoelectron diffraction, and spin polarized photoelectron diffraction [R] . Tober, E. D. 1997

机译：通过扫描隧道显微镜，位点分辨光电子衍射和自旋偏振光电子衍射研究在W（110）上生长的薄Fe和Gd薄膜的界面和表面性质

Surface Studies of Chemical-Vapor-Deposited Diamond Thin Films, Cubic Boron Nitride, and Graphite by Reflection High-Energy Electron Diffraction (RHEED), Atomic Force Microscopy (AFM), and Scanning Tunneling Microscopy (STM)

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