Infrared imaging microscopes aid in detecting integrated circuit defects

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Infrared imaging microscopes aid in detecting integrated circuit defects

机译：红外成像显微镜有助于检测集成电路缺陷

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Radiant Optronics (Singapore, Singapore; www.radiantoptronics.com) has developed an infrared (IR) microscope that is used to inspect integrated circuits (IC) for internal defects or cracks that may occur during the manufacturing process.Radiant Optronics has developed an IR microscope fitted with a SWIR camera that inspects ICs for internal defects or cracks.

机译：Radiant Optronics（新加坡，新加坡; www.radiantoptronics.com）开发了一种红外（IR）显微镜，用于检查集成电路（IC）是否存在制造过程中可能出现的内部缺陷或裂纹。装有SWIR摄像机的显微镜，可检查IC的内部缺陷或裂缝。

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《Vision Systems Design》 |2018年第1期|9-913|共2页
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Infrared imaging microscopes aid in detecting integrated circuit defects

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