Crystal Research and Technology: Journal of Experimental and Industrial Crystallography
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28.
Defect control in semiconductors. Proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, The Yokohama 21st Century Forum, Yokohama, Japan, September 17–22, 1989. North‐Holland, Amsterdam, New York, Oxford, Tokyo, 1990 Volume I 972 pages, Volume II 760 pages, Proce: US $ 436.00/Dfl. 850.00, ISBN 0444884297
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