机译:Characterization of Silicon Dioxide Films on a 4H-SiC Si(0001) Face by Fourier Transform Infrared (FT-IR) Spectroscopy and Cathodoluminescence Spectroscopy
机译:Infrared and Raman Spectroscopic Studies of Optically Transparent Zirconia (ZrO_(2)) Films Deposited by Plasma-Assisted Reactive Pulsed Laser Deposition