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首页> 外文期刊>Plant and Soil >Fractal geometry of root systems: field observations of contrasting genotypes of common bean (Phaseolus vulgaris L.) grown under different phosphorus regimes
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Fractal geometry of root systems: field observations of contrasting genotypes of common bean (Phaseolus vulgaris L.) grown under different phosphorus regimes

机译：根系的分形几何：不同磷模式下生长的普通豆（菜豆）基因型对比的实地观察

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摘要

Root growth and architecture are important for phosphorus acquisition due to the relative immobility of P in the soil. Fractal geometry is a potential new approach to the analysis of root architecture. Substantial genetic variation in root growth and architecture has been observed in common beans. Common bean (Phaseolus vulgaris) cultivars with contrasting root architecture were grown under moderate and low P conditions in a field experiment in Colombia. Linear and planar fractal dimension were measured by tracing root intercepts with vertical planes. Linear fractal dimension increased over time in efficient cultivars, but remained fairly constant over time in inefficient cultivars. Planar fractal dimension increased over time for all cultivar, but was higher in efficient than inefficient cultivars at the end of the experiment. Planar fractal dimension of medium P plants was found to correlate with shoot P content indicating fractal dimension to be a possible indicator for root P uptake. The increasing fractal dimension over time indicates that fractal analysis is a sensitive measure of root branching intensity. A less destructive method for acquisition of data that allows for continuous analysis of fractal geometry and thereby screening for more P efficient cultivars in the field is suggested. This method will allow the researcher to conduct fractal analysis and still complete field trials with final yield evaluation.
机译：由于磷在土壤中的相对固定性，根的生长和结构对于磷的吸收很重要。分形几何是潜在的根结构分析新方法。在普通豆中已经观察到根系生长和结构的大量遗传变异。在哥伦比亚的田间试验中，在中低磷条件下种植了根系结构相反的普通豆（菜豆）品种。线性和平面分形维数是通过用垂直平面跟踪根部截距来测量的。在高效品种中，线性分形维数随时间增加，但在无效品种中，线性分形维数随时间保持相当恒定。所有品种的平面分形维数都随时间增加，但是在实验结束时，有效分形的分形维数要比低效分形的分形维数高。已发现中等磷植物的平面分形维数与芽P含量相关，表明分形维数可能是根系P吸收的指标。分形维数随时间增加表明分形分析是根分支强度的敏感度量。提出了一种破坏性较小的数据采集方法，该方法可以连续分析分形几何形状，从而筛选出该领域中效率更高的P品种。这种方法将使研究人员能够进行分形分析，并最终完成最终收率评估的田间试验。

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