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首页> 外文期刊>Physics of plasmas >Two-tracer spectroscopy diagnostics of temperature profile in the conduction layer of a laser-ablated plastic foil
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Two-tracer spectroscopy diagnostics of temperature profile in the conduction layer of a laser-ablated plastic foil

机译：激光烧蚀塑料箔导电层中温度分布的双示踪光谱诊断

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摘要

A technique that combines the diagnostics of electron temperature history and the measurements of ablation velocity with two-tracer x-ray spectroscopy has been developed for diagnosing the temperature profiles in the thermal conduction layers of laser-ablated plastic foils. The electron temperature in the plastic ablator was diagnosed using the isoelectronic line ratios of Al Lyα line to Mg Ly α line, emitted from a tracer layer of Al/Mg mixture buried under the ablator. The ablation velocity was inferred from the time delay between the onset time of x-ray line emissions from Al and Mg tracer layers buried at two depths in the ablator, respectively. From the measured electron temperatures and ablation velocity, the electron temperature profile in the conduction layer was inferred. The measured temperature profile was compared with the simulated one and reasonable agreement was found.
机译：为了诊断激光烧蚀塑料箔的导热层中的温度分布，已经开发了一种结合电子温度历史诊断和消融速度测量与双示踪X射线光谱学的技术。使用从埋在烧蚀器下方的Al / Mg混合物的示踪层发射的AlLyα线与Mg Lyα线的等电线比来诊断塑料烧蚀器中的电子温度。从分别埋在消融器中两个深度处的Al和Mg示踪剂层的x射线发射开始时间之间的时间延迟推断出消融速度。根据测得的电子温度和烧蚀速度，可以推断出导电层中的电子温度分布。将测得的温度曲线与模拟温度曲线进行比较，并找到合理的一致性。

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