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Plasma curvature effects on microwave reflectometry fluctuation measurements

机译:等离子体曲率对微波反射法波动测量的影响

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摘要

Plasma poloidal curvature can significantly extend microwave reflectometry responses to high k(perpendicular to) poloidal fluctuations. Reflectometry responses can be several orders of magnitude larger at high k(perpendicular to) than that predicted by analysis based on two dimensional (2-D) slab geometry. As a result, the responses may approach the 1-D geometrical optics limit. This superresolution leads to a major modification of the spectral resolution of reflectometry. The phenomenon is analysed using a phase screen model for the general cases and the results are supported by detailed numerical 2-D realistic geometry full wave simulations for the specific case of the Alcator C-Mod tokamak. [References: 14]
机译:等离子体极向曲率可以显着扩展微波反射法对高k(垂直于)极向波动的响应。在高k(垂直于)处,反射法响应可以比基于二维(2-D)平板几何分析所预测的响应大几个数量级。结果,响应可能接近一维几何光学极限。这种超分辨率导致反射计光谱分辨率的重大改变。对于一般情况,使用相屏蔽模型分析该现象,并针对Alcator C-Mod托卡马克的特定情况,通过详细的二维逼真的几何全波仿真来支持该结果。 [参考:14]

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