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Effects of ECRH power and safety factor on laser blow-off injected impurity confinement in TCV

机译:ECRH功率和安全系数对TCV中激光吹出注入杂质的限制

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Evidence from injection into the TCV device of laser ablated, non-recycling silicon impurities shows that the transport of impurities confinement can be remarkably different from that of energy. The ratio of impurity to energy confinement times ranges from near unity in Ohmic discharges to 5 in the presence of high power ECCD. In Ohmic discharges in deuterium, above a threshold of density and of safety factor near q(95) = 4.5, the impurity confinement time increases abruptly by a factor of 2 and is sometimes accompanied by indefinite retention of non-recycling impurities within the sawtooth mixing radius.
机译:从注入到TCV器件中的激光烧蚀,不可回收的硅杂质的证据表明,杂质禁闭的传输与能量的传输明显不同。杂质与能量限制时间的比值范围从欧姆放电中的接近统一到高功率ECCD存在下的5。在氘的欧姆放电中,高于密度阈值和安全系数接近q(95)= 4.5的阈值时,杂质限制时间突然增加2倍,有时伴随着锯齿状混合中不可回收杂质的无限期保留半径。

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