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首页> 外文期刊>Plasma physics and controlled fusion >The effect of the electron temperature and current density profiles on the plasma current decay in JT-60U disruptions
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The effect of the electron temperature and current density profiles on the plasma current decay in JT-60U disruptions

机译：电子温度和电流密度分布对JT-60U中断中等离子体电流衰减的影响

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摘要

The plasma current decay during the initial phase of the current quench in JT-60U disruption has been calculated by a disruption simulation code (DINA) using the measured electron temperature T_e profile. In the case of fast plasma current decay, T_e has a peaked profile immediately after a thermal quench and the T_e profile does not change significantly during the initial phase of the current quench. On the other hand, in the case of a slow plasma current decay, the T_e profile is broader immediately after the thermal quench, and the T_e profile shrinks. The results of the DINA simulation show that the plasma internal inductance L_i increases during the initial phase of the current quench, whereas the plasma external inductance L_e does not change over time. If the plasma is represented by a simple electrical circuit, the time derivative of L_i functions as a resistance on the plasma current decay. It was confirmed that the increase in L_i is caused by current diffusion toward the core plasma due to the decrease in T_e in the intermediate and edge regions.
机译：通过使用测量的电子温度T_e曲线，通过中断模拟代码（DINA）计算了JT-60U中断中电流猝灭初始阶段的等离子体电流衰减。在快速等离子体电流衰减的情况下，T_e在热淬火后立即具有峰值曲线，并且在电流淬火的初始阶段T_e曲线不会显着变化。另一方面，在缓慢的等离子体电流衰减的情况下，在热淬火之后，T_e轮廓立即变宽，并且T_e轮廓收缩。 DINA仿真的结果表明，在电流猝灭的初始阶段，等离子体内部电感L_i会增加，而等离子体外部电感L_e不会随时间变化。如果等离子体由简单的电路表示，则L_i的时间导数用作等离子体电流衰减的电阻。可以确定的是，L_i的增加是由于中部和边缘区域中T_e的减小导致电流向核心等离子体扩散所致。

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