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Carbon concentration in the Wendelstein 7-AS stellarator measured with the high-energy Li beam

机译:用高能锂离子束测量Wendelstein 7-AS恒星器中的碳浓度

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The carbon concentration in the plasma of the stellarator experiment Wendelstein 7-AS is measured in the framework of the first island divertor campaign to examine divertor impurity control. Dedicated plasma density and electron cyclotron resonance heating power scans are performed and the influence of both the magnetic configuration and boronization of the vessel are investigated. A new diagnostic system is employed to measure C6+ densities via charge-exchange collisions with the neutral high-energy Li beam in the plasma edge and the core region. Carbon concentrations with respect to electron density are derived by using the density evaluation of the Li(2p) light profile. The results obtained during a period of approximately 2500 shots demonstrate that boronization reduces the carbon core concentration by a factor of three to a base level of 0.5-1%, which is not affected by further boronizations. The carbon concentration in island divertor configurations is found to be far below those obtained in a limiter configuration, which is attributed to a more than a factor two better impurity screening. The analysis of the carbon influx by spectroscopic measurements of C1+ radiation suggests that the carbon core concentration in discharges of different densities and heating power is adequately described using the electron density at the last closed flux surface normalized to the line-averaged electron density as a scaling parameter. This simple global approach underlines the important role of the balance of impurity sources and impurity dilution. The effect of changes in impurity confinement on the measured carbon concentrations is also discussed. [References: 23]
机译:在第一个岛状偏滤器运动的框架内,测量了恒星实验Wendelstein 7-AS血浆中的碳浓度,以检查偏滤器杂质的控制。进行了专门的等离子体密度和电子回旋共振加热功率扫描,并研究了容器的磁性和硼化的影响。一种新的诊断系统用于通过与等离子体边缘和核心区域中性高能Li束的电荷交换碰撞来测量C6 +密度。通过使用Li(2p)光分布的密度评估得出相对于电子密度的碳浓度。在大约2500次枪击期间获得的结果表明,硼化将碳芯浓度降低了三倍,达到了0.5-1%的基本水平,这不受进一步硼化的影响。发现岛偏滤器构造中的碳浓度远低于限制器构造中获得的碳浓度,这归因于两个以上的更好的杂质筛选。通过C1 +辐射的光谱测量对碳流入量的分析表明,使用归一化至线平均电子密度的最后一个封闭通量表面的电子密度,可以适当地描述不同密度和加热功率的放电中的碳核浓度参数。这种简单的全局方法强调了杂质源和杂质稀释之间的平衡的重要作用。还讨论了杂质限制变化对测得的碳浓度的影响。 [参考:23]

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