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Investigations of the process of oxidation of polyethylene film, modified with high energy electron beam, using infrared spectroscopy and photoelectron spectroscopy methods

机译:用红外光谱和光电子光谱法研究高能电子束改性聚乙烯薄膜的氧化过程

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摘要

Possibilities of application of infrared spectroscopy in polymers investigations were presented. The results of authors' research work on low density polyethylene (PE-LD) film oxidation, under the influence of high energy electron beam, have been presented. Fourier transformation infrared spectroscopy (FT-IR) (Figs. 1-4) and X-ray photoelectron spectroscopy (XPS) (Figs. 5-8) were used for estimation of PE-LD chemical structure changes occurring as a result of the process discussed. It has been stated that an oxidation degree of PE-LD film (the bulk oxidation as well as surface oxidation) increases with an increase of radiation dose. Oxidation degree of polymer surface is over fourteen times higher in case of the film modified with 280 kGy dose than for unmodified film (Fig. 9). The oxygen, combined in this process, occurs mainly in ketone, aldehyde, acidic and ester groups. An increase of radiation dose couses the increasing of number of various types of carbon and oxygen atoms bonds.
机译:提出了在聚合物研究中应用红外光谱的可能性。提出了作者在高能电子束的影响下对低密度聚乙烯(PE-LD)膜氧化的研究成果。使用傅里叶变换红外光谱(FT-IR)(图1-4)和X射线光电子能谱(XPS)(图5-8)估算由于该过程而发生的PE-LD化学结构变化讨论过。已经表明,随着辐射剂量的增加,PE-LD膜的氧化度(本体氧化以及表面氧化)增加。用280 kGy剂量改性的膜比未改性的膜,聚合物表面的氧化度高14倍以上(图9)。在此过程中结合的氧主要存在于酮,醛,酸性和酯基中。辐射剂量的增加导致各种类型的碳和氧原子键数目的增加。

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