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Reciprocity failure in HgCdTe detectors: Measurements and mitigation

机译:HgCdTe检测器的互易性故障:测量和缓解

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摘要

A detailed study of reciprocity failure in four 1.7 μm cutoff HgCdTe near-infrared detectors is presented. The sensitivity to reciprocity failure is approximately 0:1% decade~(-1) over up to 5 orders of magnitude in illumination intensity. The four detectors, which represent three successive production runs with modified growth recipes, show large differences in amount and spatial structure of reciprocity failure. Reciprocity failure could be reduced to negligible levels by cooling the detectors to about 110 K. No wavelength dependence was observed. The observed spatial structure appears to be weakly correlated with image persistence.
机译:提出了对四个1.7μm截止HgCdTe近红外探测器的互易性失效的详细研究。在高达5个数量级的照明强度下,对互易性故障的敏感度约为0:1%十年(-1)。四个检测器代表三个连续的生产运行,具有改进的生长配方,它们在互易失效的数量和空间结构上显示出很大的差异。通过将检测器冷却到约110 K,可将互易性故障降低到可以忽略的水平。未观察到波长依赖性。观察到的空间结构似乎与图像持久性弱相关。

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