Low-dose aberration corrected cryo-electron microscopy of organic specimens

James E. Evans; Crispin Hetherington; Angus Kirkland

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Low-dose aberration corrected cryo-electron microscopy of organic specimens

机译：低剂量像差校正的有机标本的冷冻电子显微镜

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摘要

Spherical aberration (C_s) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose illumination of the specimen at liquid nitrogen temperature and low defocus values. Initial images from standard inorganic and organic test specimens have indicated that under these conditions C_s-correction can provide a significant improvement in resolution (to less than 0.16 nm) for direct imaging of organic samples.

机译：透射电子显微镜中的球差（C_s）校正使无机材料的亚埃分辨率成像成为可能。为了获得对辐射敏感的有机材料的相似分辨率，需要在混合条件下操作显微镜：液氮温度下样品的低电子剂量照明和低散焦值。来自标准无机和有机试样的初始图像表明，在这些条件下，C_s校正可以对有机样品进行直接成像，从而显着提高分辨率（小于0.16 nm）。

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《Ultramicroscopy》 |2008年第12期|共9页
作者
James E. Evans; Crispin Hetherington; Angus Kirkland;
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原文格式 PDF
正文语种 eng
中图分类光学仪器;
关键词
Aberration correction; Electron microscopy; TEM; Cryo-EM;

机译：像差校正;电子显微镜;TEM;Cryo-EM;

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专利

1. Low-dose aberration corrected cryo-electron microscopy of organic specimens [J] . James E. Evans, Crispin Hetherington, Angus Kirkland Ultramicroscopy . 2008,第12期

机译：低剂量像差校正的有机标本的冷冻电子显微镜
2. Determination of aberration center of Ronchigram for automated aberration correctors in scanning transmission electron microscopy [J] . Takumi Sannomiya, Hidetaka Sawada, Tomohiro Nakamichi Ultramicroscopy . 2013,第Null期

机译：扫描透射电镜中用于自动像差校正器的Ronchigram像差中心的确定
3. Progress in aberration-corrected high-resolution transmission electron microscopy using hardware aberration correction [J] . Lentzen M Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . 2006,第3期

机译：使用硬件像差校正的像差校正高分辨率透射电子显微镜的研究进展
4. Development of an Ad-Hoc Aberration Auto-tuning Procedure on an Oriented Crystalline Specimen in Aberration-Corrected Scanning Transmission Electron Microscopy: The SIAM Method [C] . H. Sawada, M. Watanabe Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting . 2012

机译：像差校正扫描透射电子显微镜中定向晶体标本的Ad-Hoc像差自动调谐程序的开发：SIAM方法
5. Cryo-Electron Microscopy for The Study of Hybrid Materials And Biological Specimens [D] . Spoth, Katherine Anne. 2018

机译：杂交材料和生物标本研究的冷冻电子显微镜
6. Low-dose aberration corrected cryo-electron microscopy of organic specimens [O] . James E. Evans, Crispin Hetherington, Angus Kirkland, -1

机译：低剂量像差校正的有机标本的冷冻电子显微镜
7. Low-dose aberration corrected cryo-electron microscopy of organic specimens. [O] . Evans, JE, Hetherington, C, Kirkland, A, 2008

机译：低剂量像差校正的有机标本的冷冻电子显微镜。

Low-dose aberration corrected cryo-electron microscopy of organic specimens

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