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首页> 外文期刊>Polymer: The International Journal for the Science and Technology of Polymers >Morphological investigation by atomic force microscopy and light microscopy of electropolymerised polypyrrole films
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Morphological investigation by atomic force microscopy and light microscopy of electropolymerised polypyrrole films

机译：电聚合聚吡咯膜的原子力显微镜和光学显微镜的形态学研究

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摘要

Use of atomic force microscopy (AFM) together with light microscopy (LM)provides an ideal opportunity for studying the inital growth of wrinkles on polypyrrole films.In situ experiments, where continuous AFM image data acquisition was carried out during growth of thin polypyrrole films on indium-tin oxide (ITO)anodes, proved unsuccessful because the height changes occurring during the deposition proved to be too large to handle by the instrument cantilever and fell outside of the range of the z-piezo transducer,However, ex situ experiments have yielded valuable information on the earliest stages of film formation. Parallel in situ experiments where growth was followed by dynamic light microscopy imaging complemented the AFM study to yield a clear picture of the mechanism of formation of wrinkles. Additionally, the experiments confirmed that wrinkles are an integral part of the film and are not an artefact induced in films, consequent to shrinkage or drying out.
机译：原子力显微镜（AFM）与光学显微镜（LM）的结合为研究聚吡咯膜上的皱纹的初始生长提供了理想的机会。原位实验是在聚吡咯薄膜上生长期间连续进行AFM图像数据采集铟锡氧化物（ITO）阳极被证明是不成功的，因为在沉积过程中发生的高度变化被证明太大而无法通过仪器悬臂处理并且落在z压电换能器的范围之外。然而，异位实验已经产生关于成膜最早阶段的有价值的信息。在平行原位实验中进行生长，然后进行动态光学显微镜成像，这是对AFM研究的补充，以清晰地了解皱纹形成的机理。此外，实验证实，皱纹是薄膜不可或缺的一部分，而不是由于收缩或变干而在薄膜中引起的假象。

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