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首页> 外文期刊>The Analyst: The Analytical Journal of the Royal Society of Chemistry: A Monthly International Publication Dealing with All Branches of Analytical Chemistry >DETERMINATION OF FLUORIDE IN THE PRESENCE OF TETRAVALENT METAL IONS WITH AN ION-SELECTIVE ELECTRODE - APPLICATION TO RAW MATERIALS OF FLUORIDE GLASSES
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DETERMINATION OF FLUORIDE IN THE PRESENCE OF TETRAVALENT METAL IONS WITH AN ION-SELECTIVE ELECTRODE - APPLICATION TO RAW MATERIALS OF FLUORIDE GLASSES

机译:离子选择电极测定四价金属离子中的氟化物-在氟化物玻璃原料中的应用

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The performance of masking reagents, viz., ethylenediamine-N,N,N',N'-tetraacetic acid, trans-1,2-cyclohexanediamine-N,N,N',N'-tetraacetic acid, diethylenetriamine-N,N,N',N',N''-pentaacetic acid (DTPA) and triethylenetetramine-N,N,N',N'',N''',N'''-hexaacetic acid(TTHA), was studied for the determination of fluoride in the presence of Hf-IV and Th-IV using an ion-selective electrode, Hafnium(Iv) was effectively masked using an excess of DTPA at pH 6. TTHA was the best reagent for masking Th-IV, while DTPA provided an alternative for fluoride concentrations of <1 x 10(-5) mol dm(-3). The masking reaction was rapid and contamination from membrane-dissolution was negligible, Fluoride contents in raw materials of fluoride glasses, viz.,, ZrF4, HfF4, and ThF4, were determined. [References: 18]
机译:掩蔽试剂的性能,即乙二胺-N,N,N',N'-四乙酸,反式1,2-环己二胺-N,N,N',N'-四乙酸,二亚乙基三胺-N,N研究了N,N',N',N''-五乙酸(DTPA)和三亚乙基四胺-N,N,N',N'',N''',N'''-六乙酸(TTHA)使用离子选择电极在Hf-IV和Th-IV的存在下测定氟化物,在pH 6下使用过量的DTPA可以有效地掩蔽Ha(Iv)。TTHA是掩盖Th-IV的最佳试剂,而DTPA是提供了氟浓度<1 x 10(-5)mol dm(-3)的替代方法。掩蔽反应迅速,膜溶解造成的污染可忽略不计,测定了氟化玻璃原料中的氟化物含量,即ZrF4,HfF4和ThF4。 [参考:18]

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