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首页> 外文期刊>The Analyst: The Analytical Journal of the Royal Society of Chemistry: A Monthly International Publication Dealing with All Branches of Analytical Chemistry >Chip-based refractive index detection using a single point evanescent wave probe
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Chip-based refractive index detection using a single point evanescent wave probe

机译：使用单点van逝波探头的基于芯片的折射率检测

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摘要

This paper presents a novel approach for performing spectroscopic refractive index detection within microfluidic channel environments. Based on the principle of total internal reflection (TIR), changes in the refractive index of an analyte stream passing through a microfabricated channel are detected through interaction with an optical evanescent field formed at the channel wall. Refractive index variations within the micro channel environment modify the critical angle at the liquid-solid interface, thereby altering the characteristics of evanescent field formation in solution. These variations are evidenced through measurement of fluorescence intensities. Initially, the design and testing of the method are described. Subsequently, refractive index values for bulk sucrose solutions (0-35% w/v sucrose in water) are measured using the single point evandescent wave probe and compared with values obtained through conventional refractometry and the literature. Close agreement between all three approaches is demonstrated. The method is then applied to the detection of sucrose plugs (10-500 mM) hydrodynamically flowing through microfabricated channels on a planar glass chip. The evanescent wave probe is also used to selectively monitor specific analytes within a multicomponent system, by precise angular control in the vicinity of the critical angle. Although detection limits using the prototype system are non-ideal (approx 5 #mu#M carbohydrate), they compare favourably with existing methods for on-chip refractive index detection.
机译：本文提出了一种在微流体通道环境中进行光谱折射率检测的新颖方法。基于全内反射（TIR）原理，通过与通道壁上形成的光学渐逝场的相互作用，可以检测通过微细通道的分析物流的折射率变化。微通道环境中的折射率变化会改变液固界面处的临界角，从而改变溶液中van逝场的形成特性。这些变化通过荧光强度的测量证明。首先，描述了该方法的设计和测试。随后，使用单点消逝波探头测量散装蔗糖溶液（0-35％w / v蔗糖在水中）的折射率值，并将其与通过常规折射法和文献获得的值进行比较。证明了这三种方法之间的紧密一致性。然后将该方法应用于检测流体动力学流过平面玻璃芯片上微细加工通道的蔗糖塞（10-500 mM）。 van逝波探头还用于通过在临界角附近进行精确的角度控制来选择性地监控多组分系统中的特定分析物。尽管使用原型系统的检测极限是不理想的（大约5＃mu＃M碳水化合物），但与现有的片上折射率检测方法相比，它们具有优势。

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