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首页> 外文期刊>Bulletin of the Chemical Society of Japan >Imaging of Charged Micropatterned Monolayer Surfaces by Chemical Force Microscopy
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Imaging of Charged Micropatterned Monolayer Surfaces by Chemical Force Microscopy

机译:用化学力显微镜对带电的微图案单层表面进行成像

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摘要

Chemical force microscopy (CFM) was applied for the lateral force microscopic imaging of micropatterned orga-nosilane monolayer surfaces with oppositely charged phases using chemically modified cantilever tips.Chemically modified cantilever tips with oxidized mercaptosilane,aminosilane,and unmodified cantilever tip were employed as a tip for CFM.Lateral force imaging of the micropatterned surface with opposite charge was successfully achieved by controlling the pH of the aqueous solution in consideration of the electrostatic condition of functional groups on the cantilever tip and substrate surface.
机译:化学力显微镜(CFM)用于使用化学修饰的悬臂尖端对具有相反电荷的微图案有机或有机硅烷单层表面进行侧向力显微成像。考虑到悬臂末端和基体表面上官能团的静电条件,控制水溶液的pH可成功实现带有相反电荷的微图案表面的横向力成像。

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