...
  • 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>The journal of physical chemistry, B. Condensed matter, materials, surfaces, interfaces & biophysical >Quantitative Analysis of Ti-O-Si and Ti-O-Ti Bonds in Ti-Si Binary Oxides by the Linear Combination of XANES
【24h】

Quantitative Analysis of Ti-O-Si and Ti-O-Ti Bonds in Ti-Si Binary Oxides by the Linear Combination of XANES

机译：XANES线性组合定量分析Ti-Si二元氧化物中Ti-O-Si和Ti-O-Ti键

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

X-ray absorption near edge structure (XANES) of Ti K-edge of Ti-Si mixed oxides and titania supponted on silica with various Ti contents was studied toinverstigate the fractions of Ti-O-Si and Ti-O-Ti bonds quantitatively by fiting the preedge of Ti K-edge with the linear combination f two reference XANES spectra.Inmixed oxides,the fraction of Ti-O-Ti was increased up to 0.55 when Ti/Si was varied from 0.04 to 0.5 The greatest change of each fraction occurred around 0.15-0.2 of Ti/Si,which was coincident with the formation of anatase titania as observed by XRD.For titania supported on silica with a surface area of 300 m~2g~(-1),the preedge fitting results combined with XRD and XPS indicated that monolayer coverage was reached around 7-10 wt % Ti loading where the amount of Ti in Ti-O-Si was saturated to 0.56 mmol-Ti/g-material.This work demonstrated the possibility of the quantification of Ti-O-Si and Ti-O-Ti bonds in Ti-Si binary oxides by using the linear combination of reference XANES spectra.
机译：研究了不同硅含量的钛-硅混合氧化物和二氧化钛所支撑的钛-钛混合氧化物的钛K-边缘的近边缘结构（XANES）的X射线吸收，以定量地阐明钛-O-Si和Ti-O-Ti键的组成用两个参考XANES光谱的线性组合拟合Ti K边缘的前缘。当Ti / Si从0.04变为0.5时，混合氧化物中Ti-O-Ti的比例增加到0.55 XRD观察到Ti / Si含量约为0.15-0.2，这与锐钛型二氧化钛的形成相吻合。对于表面积为300 m〜2g〜（-1）的负载在二氧化硅上的二氧化钛，其前缘拟合结果与XRD和XPS结果表明，Ti含量达到7-10 wt％时，单层覆盖率达到了Ti-O-Si中的Ti量达到0.56 mmol-Ti / g材料的饱和水平。这项工作证明了Ti定量的可能性Ti-Si二元氧化物中的-O-Si和Ti-O-Ti键，通过使用参考XAN的线性组合ES光谱。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号