首页> 外文期刊>The journal of physical chemistry, C. Nanomaterials and interfaces >Chemical States of Electrochemically Doped Single Wall Carbon Nanotubes As Probed by Raman Spectroelectrochemistry and ex Situ X-ray Photoelectron Spectroscopy
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Chemical States of Electrochemically Doped Single Wall Carbon Nanotubes As Probed by Raman Spectroelectrochemistry and ex Situ X-ray Photoelectron Spectroscopy

机译:拉曼光谱电化学和非原位X射线光电子能谱探测电化学掺杂单壁碳纳米管的化学状态

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摘要

X-ray photoelectron spectroscopy(XPS)was combined with Raman spectroelectrochemistry to study the electrochemically doped states of single wall carbon nanotube(SWCNT)bundles.The ex situ measurements indicated a significant drop of doping level as compared to in situ measurements.However,after this initial decrease of the doping level,the electronic structure of SWCNT bundles was found to be stable.The XPS elemental analysis indicated that electrolyte ions penetrate into the nanotube bundles.Furthermore,for the n-doped(electrochemically reduced)sample,an increase of the relative surface concentration of different C-O groups was observed,which was caused by electrochemical reduction of ClO_4~-ions.Comparison of the ex situ Raman and XP spectra showed that an electrode potential shift of 1 V corresponds to the Fermi level shift of ca.0.5 eV.
机译:X射线光电子能谱(XPS)结合拉曼光谱电化学研究了单壁碳纳米管(SWCNT)束的电化学掺杂状态,异位测量表明掺杂水平较原位测量显着下降。掺杂水平的最初降低,发现SWCNT束的电子结构是稳定的。XPS元素分析表明,电解质离子渗透到纳米管束中。此外,对于n掺杂(电化学还原)样品,异位拉曼光谱和XP光谱的比较表明,电极电位的1V位移对应于Ca的费米能级位移,这是由ClO_4〜-离子的电化学还原引起的。 0.5 eV。

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