While electron beam-induced fragmentation (EBIF) has been reported to result in the formation of nanocrystals of various compositions, the physical forces driving this phenomenon are still poorly understood. We report EBIF to be a much more general phenomenon than previously appreciated, operative across a wide variety of metals, semiconductors, and insulators. In addition, we leverage the temperature dependent bandgap of several semiconductors, using in situ cathodoluminescence spectroscopy, to quantify the thermal contribution to EBIF and find extreme temperature rises upward of 1000 K.
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