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Quantum-chemical study on the reaction between GeF_4 and Si_2H_6

机译:GeF_4与Si_2H_6反应的量子化学研究

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摘要

To obtain a clue for understanding the low-temperature thermal chemical vapor deposition reported by Hanna et al., we studied the difference of the chemical reactivities in gas-phase between Si_2H_6 and SiH_4 with GeF_4 by quantum-chemical techniques. The calculaiton of electronic states was carried out at the CCSD(t)//B3LYP(+ZPE) levle. For the Si-Ge bond formation reaction between GeF_4 and Si_2H_6, the activation energy is 36.77 kcal/mol and the reaction is exothermic by 17.67 kcal/mol, while for the reaction between GeF_4 and SiH_4 the activation energy is 54.68 kcal/mol and the reaction is endothermic by 18.43 kcal/mol. One of the products in these reactions, SiH_3GeF_3, is easily decomposed into SiH_3F and GeF_2.
机译:为了获得理解Hanna等人报道的低温热化学气相沉积的线索,我们通过量子化学技术研究了Si_2H_6和SiH_4与GeF_4在气相中化学反应性的差异。电子态的计算是在CCSD(t)// B3LYP(+ ZPE)级进行的。对于GeF_4与Si_2H_6之间的Si-Ge键形成反应,活化能为36.77 kcal / mol,反应放热为17.67 kcal / mol,而对于GeF_4与SiH_4之间的反应,活化能为54.68 kcal / mol,反应吸热为18.43 kcal / mol。这些反应的产物之一,SiH_3GeF_3,很容易分解为SiH_3F和GeF_2。

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