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首页> 外文期刊>X-Ray Spectrometry: An International Journal >An interactive graphical user interface (GUI) for the CATGIXRF program - for microstructural evaluation of thin film and impurity doped surfaces
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An interactive graphical user interface (GUI) for the CATGIXRF program - for microstructural evaluation of thin film and impurity doped surfaces

机译：用于CATGIXRF程序的交互式图形用户界面（GUI）-用于薄膜和杂质掺杂表面的微观结构评估

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摘要

This paper is a continuation and extension of our earlier work (X-ray Spectrom. 2010, 39, 127-134, DOI:10.1002/xrs.1215) on the development of a software platform CATGIXRF, as a solution to provide non-destructive evaluation of nanostructured materials. Here, we describe an interactive graphical user interface (GUI) for the CATGIXRF program. The newly developed GUI interface facilitates determination of microstructural parameters on angstrom length scale for the nanostructured thin layered materials using synchrotron as well as laboratory X-ray sources. It allows combined analysis capabilities for both the X-ray reflectivity and grazing incidence X-ray fluorescence (GIXRF) data simultaneously, thus enabling us a greater sensitivity for the determination of microstructural parameters such as thickness, interface mixing, and roughness of a thin film medium with improved accuracies. The utility and various newly added salient features of the GUI-CATGIXRF program are described by providing example calculations as well as by analyzing experimentally a few thin film structures with different surface-interface properties. Copyright (c) 2016 John Wiley & Sons, Ltd.
机译：本文是我们早期工作（X-ray Spectrom。2010，39，127-134，DOI：10.1002 / xrs.1215）在软件平台CATGIXRF的开发上的延续和扩展，作为提供无损检测的解决方案纳米结构材料的评估。在这里，我们描述了CATGIXRF程序的交互式图形用户界面（GUI）。新开发的GUI界面便于使用同步加速器以及实验室X射线源确定纳米级薄层材料的埃长度尺度上的微结构参数。它允许同时对X射线反射率和掠入射X射线荧光（GIXRF）数据进行组合分析，从而使我们能够更灵敏地确定微观结构参数，例如厚度，界面混合和薄膜粗糙度精度提高的媒体。通过提供示例计算以及通过实验分析一些具有不同表面界面特性的薄膜结构，来描述GUI-CATGIXRF程序的实用程序和各种新添加的显着特征。版权所有（c）2016 John Wiley＆Sons，Ltd.

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