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A Tool for Single-Fault Diagnosis in Linear Analog Circuits with Tolerance Using the T-Vector Approach

机译:使用T向量方法的具有容差的线性模拟电路中的单故障诊断工具

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摘要

In previous works of these authors, a technique for doing single-fault diagnosis in linear analog circuits was developed. Under certain conditions, one of them assuming nominal values for the circuit parameters, it was shown that only two measurements taken on two selected circuit nodes, at a single frequency, were needed to detect and diagnose any parametric fault. In this paper, the practical value of the technique is improved by extending the application to the diagnosis of faults in circuits with parameters subject to tolerance. With this in mind, single parametric faults with several strengths are randomly injected in the circuit under study and, afterwards, these faults are diagnosed (or the diagnosis fails). Results are reported on a simple active filter. Conclusions are drawn about the robustness and effectiveness of the technique.
机译:在这些作者的先前工作中,开发了一种在线性模拟电路中执行单故障诊断的技术。在某些条件下,其中一个假设电路参数的标称值,结果表明,仅需在两个选定的电路节点上以单个频率进行两次测量,即可检测和诊断任何参数故障。在本文中,该技术的实用价值通过将其应用扩展到参数受容限的电路的故障诊断中而得以提高。考虑到这一点,将具有多个强度的单个参数故障随机注入正在研究的电路中,然后,对这些故障进行诊断(或诊断失败)。结果通过简单的有源过滤器报告。得出有关该技术的鲁棒性和有效性的结论。

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