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Reflection and phase of left-handed metamaterials at microwave frequencies

机译:左手超材料在微波频率下的反射和相位

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We experimentally investigated the reflection and phase of the left-handed metamaterials (LHMs) in a rectangular waveguide for the normally incident microwave. The samples are constructed by periodically arraying the copper split ring resonators (SRRs) and wires. It is found that for the LHMs with one-layered SRRs, a reflection peak with a depth of -3.3 dB (i.e. with the reflectivity of 47%) occurs in the left-handed range. The dependence of reflection phase on the frequency is different from that of the transmission phase, and the reflection phase has an inflexion at the reflection peaks. For the LHMs with three-layered SRRs, the depth of reflection peak increases with the row number, i.e. reflection is weakened, and the reflection peak has a shift with respect to the left-handed transmission peak. It is thought that the interaction between different layers of SRRs is the reason of the shift.
机译:我们实验研究了正交入射微波在矩形波导中左手超材料(LHMs)的反射和相位。通过定期排列铜开口环谐振器(SRR)和导线来构造样本。发现对于具有单层SRR的LHM,在左手范围中出现深度为-3.3dB(即,反射率为47%)的反射峰。反射相位对频率的依赖性与透射相位的依赖性不同,并且反射相位在反射峰值处具有弯曲。对于具有三层SRR的LHM,反射峰的深度随行数增加而增加,即反射减弱,并且反射峰相对于左手透射峰发生偏移。可以认为,SRR的不同层之间的交互是发生这种变化的原因。

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